Discovery of fully efficient fault indicators along a data-based diagnosis process

来源摘要

arXiv:2609.28087v1 Announce Type: new Abstract: The integration of model-based and data-driven paradigms provides a powerful framework for fault diagnosis by combining the interpretability of analytical redundancy relations, i.e., input-output relations that are used as diagnosis indicators in model-based diagnosis, with the adaptability of learning techniques. DT4X is a recent diagnosis algorithm that uses symbolic regression to generate multivariate relations leveraging some properties of analytical redundancy relations and uses them as split functions in a decision tree. However, its symbolic regression procedure optimizes only the separation between two selected classes at each node, often fragmenting the remaining classes and degrading both interpretability and diagnosis performance. This paper introduces DT4X+, an enhanced version of DT4X that modifies the construction of training sets and the symbolic-regression loss so that expressions separate the target classes while preserving the coherence of non-target classes. The resulting relations become fully consistent with ARR properties and lead to more informative splits, improved robustness, and better performance on dynamic-system datasets. Experiments conducted on several benchmark systems demonstrate the benefits of this enhanced formulation.